BTI-Aware Timing Reliability Improvement of Pulsed Flip-Flops in Nano-Scale CMOS Technology

IEEE Transactions on Device and Materials Reliability(2021)

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摘要
Pulsed Flip-flops (FFs) are popular elements in the design of high-speed microprocessors. Technology scaling has led to a considerable increase in manufacturing process variation and aging phenomena affecting the reliability of these FFs. In this paper, the timing reliability of pulsed FFs is improved using a transistor-level restructuring technique. In this technique, we modify the pull-down netw...
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关键词
Reliability,Integrated circuit reliability,Transistors,Clocks,Reliability engineering,Stress,Delays
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