BTI-Aware Timing Reliability Improvement of Pulsed Flip-Flops in Nano-Scale CMOS Technology

Atousa Jafari,Mohsen Raji,Behnam Ghavami

IEEE Transactions on Device and Materials Reliability（2021）

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摘要

Pulsed Flip-flops (FFs) are popular elements in the design of high-speed microprocessors. Technology scaling has led to a considerable increase in manufacturing process variation and aging phenomena affecting the reliability of these FFs. In this paper, the timing reliability of pulsed FFs is improved using a transistor-level restructuring technique. In this technique, we modify the pull-down netw...

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关键词

Reliability,Integrated circuit reliability,Transistors,Clocks,Reliability engineering,Stress,Delays

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