Analysis of Floating Limiting Rings Termination under Repetitive Avalanche Current Stress for 4H-Sic JBS Rectifiers
IEEE Transactions on Device and Materials Reliability（2021）
Key words
Stress,Electric fields,Electron traps,Current measurement,Rectifiers,Stress measurement,Voltage measurement,Breakdown voltage,4H-SiC,FLRs termination,repetitive avalanche current stress
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