A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations
Computational Materials Science(2021)
摘要
Overview of the developed framework for automated analysis of defects based on the YOLO deep learning method.
更多查看译文
关键词
Deep learning,Automatic defect analysis,In-situ TEM,Ion irradiations,Object detection,Object tracking
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要