An Ordinal Optimization-Based Approach To Die Distribution Estimation For Massive Multi-site Testing Validation: A Case Study

Multisite testing has become a proven method to reduce test time and costs for integrated circuits (IC). However, the technique suffers from site-to-site variations, especially when a large number of test sites are involved. It becomes imperative to identify issue sites that exhibit unacceptable variations to prevent yield loss or incorrect passing of faulty devices. By correctly identifying the t...