Soft-Error-Aware Read-Decoupled SRAM With Multi-Node Recovery for Aerospace Applications

Soumitra Pal,Sayonee Mohapatra,Wing-Hung Ki,Aminul Islam

IEEE Transactions on Circuits and Systems II: Express Briefs（2021）

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摘要

In advanced technology nodes, SRAM cells, used in the aerospace industry, have become highly susceptible to soft-error. In this brief, a Soft-Error-Aware Read-Decoupled 14T (SAR14T) SRAM cell is proposed for aerospace applications. To assess the performance of the proposed cell, it is compared with other soft-error-aware SRAM cells, like WE-QUATRO, QUCCE12T, RHD12T, RSP14T and RHBD14T. Simulation ...

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关键词

Single event upsets,Transistors,SRAM cells,MOS devices,Impedance,Delays,Layout

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