The Results of the Development of the AFM Images Analysis Software

PROCEEDINGS OF THE 2021 IEEE CONFERENCE OF RUSSIAN YOUNG RESEARCHERS IN ELECTRICAL AND ELECTRONIC ENGINEERING (ELCONRUS)(2021)

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摘要
It becomes necessary to automate the processing and analyzing a large amount of data. This article presents the results obtained by using the software developed for analyzing AFM images. This software can be used in various fields for the analysis of heterogeneous surfaces. The algorithms of preliminary processing of images to remove artifacts and to segment images were used. Processing is based on binarization and the usage of a window function to detect segment boundaries. The developed software allows processing image and obtaining statistical data of the size and position of heterogeneous located on scanning objects. Examples of using the developed software for analyzing the size and number of particles applied on glass substrates are given.
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关键词
atomic force microscope, image processing, scans
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