Numerical Analysis of X-Ray Diffraction Reflection Spectra of AlGaAs/GaAs Superlattices Depending on Structural Parameters

Ilinov D. V.,Shabrin A. D.,Goncharov A. E., Russian Technological University MIREA

Journal of Communications Technology and Electronics（2021）

引用 0|浏览12

关键词

X-ray diffractometry,superlattices,multilayer structure,transfer matrix,rocking curves,AlGaAs solid solution

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