Special Session: Physical Attacks through the Chip Backside: Threats, Challenges, and Opportunities

2021 IEEE 39th VLSI Test Symposium (VTS)(2021)

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摘要
This paper reviews the evolution of a powerful class of physical attacks against integrated circuits (ICs), developed initially for performing failure analysis (FA) from the IC backside. Over the last two decades, several publications have demonstrated the effectiveness of these techniques in bypassing the IC protection schemes and extracting the stored assets inside secure ICs. In this work, we t...
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Integrated optics,Particle beam optics,Law enforcement,Machine learning,Tools,Very large scale integration,Packaging
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