A Novel Dynamic Time Method for Organic Light-Emitting Diode Degradation Estimation in Display Application

This work presents a time discretization strategy to estimate the current degradation of OLED devices in circuit-level simulation. An equivalent time point method is used to calculate degradation rate appropriately under dynamic bias conditions, and temperature effect due to ambient or device self-heating during operation is also included. Groups of OLEDs with various aging conditions are measured...