Phase Noise and Jitter Measurements in SEU-Hardened CMOS Phase Locked Loop Design

Single event upset (SEU) is a significant problem in analog, digital, and mixed signal circuits. The extent of the attacks increases in radiation susceptible environments such as military and aerospace. Phase locked loop (PLL) is ubiquitous and usually employed as data recovery or clock signal in some electronic devices used in these environments. Single event transient causes ionizing particles t...