A Novel Leaky-FeFET Based True Random Number Generator with Ultralow Hardware Cost for Neuromorphic Application

2021 5th IEEE Electron Devices Technology & Manufacturing Conference (EDTM)(2021)

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摘要
In this work, a novel Leaky-FeFET (L-FeFET) based true random number generator (TRNG) with only one transistor is proposed and experimentally demonstrated for neuromorphic application. By utilizing intrinsic stochastic dynamic process of ferroelectric domains nucleation, and accelerating polarization degradation, the L-FeFET can generate controllable random bits without peripheral circuits. Based ...
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关键词
Degradation,Neuromorphics,NP-hard problem,Neural networks,Process control,Generators,Hardware
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