Cryogenic Characterization of Low-frequency Noise Based on Cryo-CMOS: Impact of Interface Trap DensityHiroshi Oka,Takashi Matsukawa,Kimihiko Kato, Shota Iizuka,Wataru Mizubayashi,Kazuhiko Endo,Tetsuji Yasuda,Takahiro MoriBulletin of the American Physical Society(2021)引用 0|浏览1暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要