Wafer-Scale Encapsulated Saw Temperature and Pressure Sensors for Harsh Environments

Eldwin J. Ng,Jaibir Sharma,Eva Wai Leong Ching,Guoqiang Wu, Didier Pohl, Olivier Vancauwenberghe

2021 IEEE 34th International Conference on Micro Electro Mechanical Systems (MEMS)(2021)

引用 3|浏览0
暂无评分
摘要
Passive SAW sensors do not require circuitry or power and are ideal for harsh environments or rotating machinery. AlN-based thin film SAW resonators for temperature and pressure sensors have been developed in this work using AlGe wafer-scale encapsulation for device protection, pressure reference, high stability, and small size. Temperature and pressure co-testing of both sensors up to 160°C and 60 bar revealed ~1% full-scale accuracy.
更多
查看译文
关键词
Surface Acoustic Wave (SAW),Temperature Sensors,Pressure Sensors,Wafer-scale Encapsulation
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要