First Demonstration of Ultrafast Laser Annealed Monolithic 3D Gate-All-Around CMOS Logic and FeFET Memory with Near-Memory-Computing Macro

international electron devices meeting(2020)

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摘要
For the first time, ultrafast laser annealed BEOL gate-all-around (GAA) transistor and FeFET memory were demonstrated with monolithic 3D near-memory-computing (NMC) circuit. The GAA MOSFETs employing ultrafast picosecond visible laser dopant activation exhibit record-high Ion (nFETs=407 uA/um, pFETs=345 uA/um). The BEOL FeFETs memory exhibits large memory window ΔV th = 1.2V, more than 106 cycle endurance. Moreover, the 3D stackability of the GAA MOSFETs and FeFET memory bit cell enable reduces the area of the NMC circuitry and improve the readout throughput.
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关键词
readout throughput,NMC circuitry,3D stackability,memory window,monolithic 3D near-memory-computing circuit,near-memory-computing macro,ultrafast picosecond visible laser dopant activation,BEOL FeFETs memory,ultrafast laser annealed monolithic 3D gate-all-around CMOS logic,FeFET memory bit cell,GAA MOSFETs,BEOL gate-all-around transistor,voltage 1.2 V
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