Comparing process-based wheat growth models in their simulation of yield losses caused by plant diseases

•WHEATPEST approach was transferred to four crop models to simulate yield losses due to diseases.•A benchmark field dataset was used to run two model calibrations with increasing data availability.•A factorial simulation experiment allowed evaluating models behavior in simulating yield losses.•Maximum severity had the strongest effect on simulated actual yield and absolute yield losses.•The guide for the implementation of the damage mechanisms into crop models is released.