Towards Overlay-based Rapid In-Circuit Tuning of Deep Learning Designs

2020 International Conference on Field-Programmable Technology (ICFPT)(2020)

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摘要
This paper presents a novel overlay-based approach for rapid in-circuit debugging and tuning of Deep Learning (DL) designs targeting Field-Programmable Gate Array (FPGA). We first propose overlay-based instruments designed to provide profiling information of hardware to builders of deep learning applications for tuning and debugging FPGA designs. Our instrumentation is optimized to take advantage ...
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关键词
Deep learning,Visualization,Instruments,Neural networks,Debugging,Hardware,Tuning
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