Back End Of Line opportunities and reliability challenges for future technology nodes

Mauro J. Kobrinsky, Rahim Kasim

2021 IEEE International Reliability Physics Symposium (IRPS)(2021)

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摘要
In this paper, we describe both evolutionary and disruptive Back End Of Line innovations needed to enable scaling and performance improvements, and their reliability impact.
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关键词
Technological innovation,Reliability,Physics
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