Soft-Error Resilient Read Decoupled SRAM With Multi-Node Upset Recovery for Space Applications

Soumitra Pal,Dodla Divya Sri,Wing-Hung Ki,Aminul Islam

IEEE Transactions on Electron Devices（2021）

引用 27|浏览2

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摘要

Space consists of high-energy particles and high-temperature fluctuations, which causes single event upsets (SEUs). Conventional 6T static random access memory (SRAM) is unable to tolerate this harsh environment in space. Therefore, it is necessary to design an SRAM, which can withstand this harsh environment. In order to mitigate SEUs, a radiation-hardened SRAM cell, named soft-error resilient re...

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关键词

Transistors,Transient analysis,Single event upsets,Delays,Aerospace electronics,SRAM cells,MOS devices

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