Algorithm-Driven Advances for Scientific CT Instruments: From model-based to deep learning-based approaches
IEEE Signal Processing Magazine(2022)
摘要
Multiscale 3D characterization is widely used by materials scientists to further their understanding of the relationships between microscopic structure and macroscopic function. Scientific computed tomography (SCT) instruments are one of the most popular choices for 3D nondestructive characterization of materials at length scales ranging from the angstrom scale to the micron scale. These instrumen...
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关键词
Three-dimensional displays, Instruments, Computed tomography, Volume measurement, Signal processing algorithms, X-rays, Reconstruction algorithms
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