The Effect of the Dielectric End Groups on the Positive Bias Stress Stability of N2200 Organic Field Effect TransistorsD. Simatos,L. J. Spalek,U. Kraft,M. Nikolka,X. Jiao,C. R. McNeill,D. Venkateshvaran,H. SirringhausAPL MATERIALS（2021）引用 14|浏览36AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
