A position sensitive β−γ coincidence technique for sample analysis with the upgraded PANDA device

Abstract PANDA (Particles And Non-Destructive Analysis) is measuring system developed for non-destructive analysis of samples for safety, security and safeguards. The capabilities of the PANDA device were expanded by the addition of a thick silicon detector for β particle detection. The upgraded device can now be used for position-sensitive α − γ and β − γ coincidence measurements of various kinds of radioactive samples. The capability of the PANDA device in using the β − γ coincidence technique was tested using a mixed source of 134Cs and 226Ra. In addition, the ability of PANDA to locate nuclides emitting β particles from samples was tested using a combined sample containing a mixed 134Cs and 226Ra source and a pure 226Ra source placed a few centimeters apart from each other. The construction, commissioning and testing of the upgraded PANDA device is discussed.