Direct Visualization of Breakdown-Induced Metal Migration in Enhanced Modified Lateral Silicon-Controlled Rectifiers

Xinqian Chen,Feibo Du,Chaolun Wang,Hejun Xu, Yuxin Zhang,Fei Hou,Xin Yang,Yongren Wu,Chihang Tsai, Zhirong Chen, Yurou Guo,Zhiwei Liu,Xing Wu

IEEE transactions on electron devices/IEEE transactions on electron devices（2021）

引用 10|浏览15

关键词

Nickel,Electric breakdown,Cathodes,Electrostatic discharges,Anodes,Silicides,Silicon,Electrical breakdown,electrostatic discharge (ESD),failure analysis,silicon-controlled rectifier (SCR),transmission electron microscopy

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