Entropy Reduction Model for Pinpointing Differential Fault Analysis on SIMON and SIMECK Ciphers

Naman Singhal,Priyanka Joshi,Bodhisatwa Mazumdar

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems（2021）

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摘要

In this article, we present a formal model of entropy reduction across the rounds when a fault is injected in SIMON and SIMECK family of lightweight ciphers. The model helps to pinpoint a range of intermediate rounds in a cipher of the same family, which when subjected to a fault injection requires minimal number of such attempts to reveal the secret key. The range of such rounds depict increased ...

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关键词

Ciphers,Circuit faults,Registers,Entropy,Analytical models,Integrated circuit modeling,Computational modeling

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