On the Response of a Micro Non-Destructive Testing X-ray DetectorDionysios Linardatos,Vaia Koukou,Niki Martini,Anastasios Konstantinidis,Athanasios Bakas,George Fountos,Ioannis Valais,Christos MichailMaterials（2021）引用 23|浏览4关键词CMOS,imaging,Gd2O2S,Tb,ZnSe,Te,non-destructive testing,DQE,scintillators,IEC 62220-1-1,2015AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
