Image Registration In Multi-Modal Scanning Microscopy: A Solar Cell Case Study
2020 47TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)(2020)
摘要
Scanning probe measurements are an indispensable tool of solar cell research today, and the compatibility with simultaneous acquisition of complementary measurement modes is a particular strength. However, multi-modal data acquisition is often limited by different scan-parameter requirements. As a consequence, the modalities may be assessed subsequently rather than simultaneously. In this instance, image registration serves as a tool to align two-dimensional datasets at nanoscale. Here, we showcase an example of two subsequent scanning Xray microscopy measurements of solar cells with a Cu(In,Ga)Se-2 absorber, the first measurement being optimized for X-ray beam induced current and the second for X-ray fluorescence. We discuss different approaches and pitfalls of image registration and its potential combination with Gaussian filtering. This finally allows us to proceed with the investigation of point-by-point correlations.
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关键词
Image registration, CIGS solar cells, X-ray microscopy, X-ray fluorescence (XRF), X-ray beam induced current (XBIC), Gaussian filter
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