Defect Loss and Its Physical Processes

Jian Fu Zhang,Meng Duan,Mehzabeen Mehedi,Kean Hong Tok, Zeliang Ye,Zhigang Ji,Weidong Zhang

IEEE International Conference on Solid-State and Integrated Circuit Technology（2020）

引用 0|浏览13

关键词

defect loss,physical processes,device performance,threshold voltage,driving current,operation speed,device lifetime,interface states,anti-neutralization positive charges,thermally activated process,MOSFET

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要