Study on the Hardening of Single-Event Transient in D-type Flip-Flop Based on InP HBT
2020 IEEE 15th International Conference on Solid-State & Integrated Circuit Technology (ICSICT)（2020）
Key words
D-type flip-flop (D-FF),InP,heterojunction bipolar transistor (HBT),single-event transient (SET),hardened circuit
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