Characterizing Crystalline Defects in Single Xe Nanoparticles from Angular Correlations of Single-Shot Diffracted X-rays
A. Niozu,Y. Kumagai,T. Nishiyama,H. Fukuzawa,K. Motomura, M. Bucher,Y. Ito,T. Takanashi,K. Asa,Y. Sato,D. You,Y. Li,T. Ono,E. Kukk,C. Miron,L. Neagu,C. Callegari,M. Di Fraia,G. Rossi,D. E. Galli,T. Pincelli,A. Colombo,T. Kameshima,Y. Joti,T. Hatsui,S. Owada,T. Katayama,T. Togashi,K. Tono,M. Yabashi,K. Matsuda,C. Bostedt,K. Nagaya,K. Ueda 31ST INTERNATIONAL CONFERENCE ON PHOTONIC, ELECTRONIC AND ATOMIC COLLISIONS (ICPEAC XXXI)（2020）
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