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Guest Editor'S Introduction: Special Section On Reliability-Aware Design And Analysis Methods For Digital Systems: From Gate To System Level
IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, no. 3 (2020): 561-563
EI
Abstract
The fourteen articles in this special section represent world-leading current research into reliability-aware design methods for digital systems and provide interesting and valuable insights into current and future trends in the considered research areas. The focus on these articles is on investigating novel solutions for the reliability-...More
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