Measurement Of Temperature-Dependent Linewidth Enhancement Factor In A 1550 Nm Vcsel

JOURNAL OF MODERN OPTICS(2020)

引用 1|浏览0
暂无评分
摘要
In this paper, we have investigated experimentally measured temperature-dependent Linewidth Enhancement Factor (alpha) of solitary 1550 nm InAlGaAs-InP multi-quantum-well vertical-cavity surface-emitting lasers (VCSELs). The temperature effects on (alpha) are investigated for a temperature range of -20 degrees C to 60 degrees C. Comparison is made between the experimental observations and theoretical predictions of similar VCSELs and with those different in wavelength or materials or in both.
更多
查看译文
关键词
Linewidth enhancement factor, vertical-cavity surface-emitting lasers, semiconductor lasers
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要