Signal Control Switching for Improving Large Array Devices' ESD Performances
2020 IEEE International Conference on Consumer Electronics - Taiwan (ICCE-Taiwan)(2020)
摘要
Electrostatic Discharge (ESD) performance of large array device (LAD) is a big challenge since the common ESD skill cannot be used. A novel signal control switching (SCS) architecture for adding LAD's ESD robustness is proposed in this paper. A little layout area is increased, but a huge ESD robustness increase can be obtained.
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关键词
signal control switching,electrostatic discharge performance,common ESD skill,LAD ESD robustness,large array devices,SCS architecture,layout area
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