Enhanced Electrical Properties of Solution-processed Oxide Thin Film Transistors by Using ZrO2 Gate Dielectric Deposited by Oxygen-doped SolutionChunlai Luo,Ting Huang,Changhao Li,Yan Zhang, Zhengmiao Zou,Yushan Li,Ruiqiang Tao,Jinwei Gao,Guofu Zhou,Xubing Lu,Junming LiuJournal of Physics D(2020)引用 0|浏览7暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要