Double-spherically bent crystal high-resolution X-ray spectroscopy of spatially extended sources

An aberration-free imaging technique was used to design a double-spherically bent crystal spectrometer with high energy and spatial resolutions to ensure that the individual spectral lines are represented as perfectly straight lines on the detector. After obtaining the matched parameters of the two crystals via geometry-based optimization, an alignment method was employed to allow the spacing between the crystals and the detector to be coupled with the source. The working principle of this spectrum-measuring scheme was evaluated using a Cu X-ray tube. High-quality spectra with energy resolutions (E/Delta E) of approximately 3577 were obtained for a relatively large source size.