Influence of Substrate Resistivity on Porous Silicon Small-Signal RF Properties
IEEE Transactions on Electron Devices(2020)
摘要
This article provides guidelines to design porous silicon (PS) layers regarding optimization of smallsignal properties in passive structures for radio frequency (RF): insertion loss and crosstalk. Results are based on high-frequency measurements on 200-mm wafers and electromagnetic simulations up to 40 GHz. Using substrate resistivity below 1 Ω cm allows the best tradeoff with minimized PS thickness.
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关键词
Crosstalk,linear attenuation coefficient,porous silicon (PS),S-parameters,substrate resistivity
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