TCAD Framework for HCD Kinetics in Low VD Devices Spanning Full VG/VD Space
IEEE Transactions on Electron Devices（2020）
Key words
Hot carriers,interface trap generation,parametric drift,reaction diffusion drift (RDD) model,self-heating (SH) effect,technology CAD (TCAD)
AI Read Science
Must-Reading Tree
Example
Generate MRT to find the research sequence of this paper
Chat Paper
Summary is being generated by the instructions you defined