Detectability evaluation of attributes anomaly for electronic components using pulsed thermography

Haochen Liu,Lawrence Tinsley,Sri Addepalli,Xiaochen Liu,Andrew Starr,Yifan Zhao

Infrared Physics & Technology（2020）

引用 3|浏览6

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摘要

•Finite element modelling is used for simulating anomaly of electronic components.•Pulsed thermography can effectively detect counterfeit electronic components.•Machine learning with thermal signature can enhance the detectability of counterfeit.

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关键词

Counterfeit electronic components,Attributes anomaly,Pulsed thermography,Detectability evaluation,Machine learning

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