VNA-Based Material Characterization in THz Domain without Classic Calibration and Time-Gating

Alireza Kazemipour,Johannes Hoffmann,Michael Wollensack,Djamel Allal,Martin Hudlicka,Juerg Ruefenacht,Daniel Stalder,Markus Zeier

conference on precision electromagnetic measurements（2020）

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摘要

A method is presented to measure materials and extract the complex permittivity without using classic VNA calibrations and time-gating. It is based on frequency selective normalization, analyzing error-terms and multiple-reflection phenomena. Measurement results (in free-space) are presented in 75-110 GHz and 500-750 GHz bands. The new normalization technique reduces uncertainties and simplifies the process.

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关键词

thz domain,material characterization,vna-based,time-gating

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