Characterization Of The Percival Detector With Soft X-Rays

JOURNAL OF SYNCHROTRON RADIATION(2021)

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摘要
In this paper the back-side-illuminated Percival 2-Megapixel (P2M) detector is presented, along with its characterization by means of optical and X-ray photons. For the first time, the response of the system to soft X-rays (250 eV to 1 keV) is presented. The main performance parameters of the first detector are measured, assessing the capabilities in terms of noise, dynamic range and single-photon discrimination capability. Present limitations and coming improvements are discussed.
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关键词
Percival, detector, soft X-rays, CMOS Imager, photon science
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