Low Temperature Cvd Of Thermoelectric Snte Thin Films From The Single Source Precursor, [(Bu3sn)-Bu-N((Tebu)-Bu-N)]

This work has demonstrated that the single source precursor [(Bu3Sn)-Bu-n((TeBu)-Bu-n)], bearing n-butyl groups and containing the necessary 1 : 1 Sn : Te ratio, facilitates growth of continuous, stoichiometric SnTe thin films. This single source CVD precursor allows film growth at significantly lower temperatures (355-434 degrees C at 0.01-0.05 Torr) than required for CVD from SnTe powder. This could be advantageous for controlling the surface states in topological insulators. The temperature-dependent thermoelectric performance of these films has been determined, revealing them to be p-type semiconductors with peak Seebeck coefficient and power factor values of 78 mu V K-1 and 8.3 mu W K-2 cm(-1), respectively, at 615 K; comparing favourably with data from bulk SnTe. Further, we have demonstrated that the precursor facilitates area selective growth of SnTe onto the TiN regions of SiO2/TiN patterned substrates, which is expected to be beneficial for the fabrication of micro-thermoelectric generators.