Ptychographic Wavefront Characterization for Single-Particle Imaging at X-Ray LasersBenedikt J. Daurer,Simone Sala,Max F. Hantke,Hemanth K. N. Reddy,Johan Bielecki,Zhou Shen,Carl Nettelblad,Martin Svenda,Tomas Ekeberg,Gabriella A. Carini,Philip Hart,Timur Osipov,Andrew Aquila,N. Duane Loh,Filipe R. N. C. Maia,Pierre ThibaultOptica(2020)引用 15|浏览92关键词Ptychography,Phase Contrast Imaging,Diffraction MicroscopyAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要