Solid-State Analysis Of Alpha-Cyclodextrin Inclusion Complexes Using Low-Frequency Raman Spectroscopy

A rapid and nondestructive analytical technique is critical for the analysis of cyclodextrin inclusion complexes in solid dosage forms. This study proposed a newly developed low-frequency Raman spectroscopy as a candidate technique for the analysis of cyclodextrin inclusion complexes. In this study, we selected a typical series of five crystalline cyclodextrin inclusion complexes and reported the usefulness of Raman spectroscopy for analyzing these inclusion complexes. Some inclusion complexes clearly differed from the raw materials in conventional Raman spectra. In another case, though specific differences were not observed between inclusion complexes and raw materials in conventional Raman spectra, clear differences were observed in V low-frequency Raman spectra. Moreover, no characteristic differences between inclusion complexes consisting of different guest molecules were observed in conventional Raman spectra. The characteristic differences were observed only in low-frequency Raman spectra. Therefore, low-frequency Raman spectroscopy is a useful technique for solid-state analysis of crystalline inclusion complexes.