Correction of incident rays' intensity for fluorescent X-ray CT using synchrotron radiation

We present a correction technique of incident X-rays' intensity for Fluorescent X-ray Computed Tomography using Synchrotron Radiation (SR-FXCT) to achieve enough image quality applicable for quantitative measurement. The incident intensity lust in front of an object is not precisely in proportion to the ring current of the accelerator and so far they have been employed for the correction, while they are strongly correlated. In this research, we correct the incident intensity by introducing a PIN diode detector to monitor the X-ray intensity in front of the object, and confirm its effectiveness by obtained sinogram for plastic phantom.