Transmission electron microscopy analysis and electrical measurements of carbon thin films

The paper performs studies on carbon thin films based on electron microscopy data and electrical measurements are reported. The samples were obtained by Thermionic Vacuum Arc (TVA) method. Techniques used to acquire information were BF-TEM (Bright Field Transmission Electron Microscopy), DF-TEM (Dark Field Transmission Electron Microscopy), HRTEM (High Resolution Transmission Electron Microscopy), SAED (Selected Area Electron Diffraction) and Radial Distribution Function (RDF).