Thermo-hydrodynamic transient modeling of vertical Bridgman growth

JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS(2000)

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摘要
Velocity and temperature fields in the growth of semiconductor by the vertical Bridgman method are studied by numerical modeling using the finite element code FIDAP. A free surface model is applied for the description of the transient process. Using the numerical results the solid-liquid interface evolution with time is discussed.
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关键词
vertical Bridgman growth,numerical simulation,transient analysis,interface deflection
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