[100] Directional alignment of Ni-based single- crystal superalloys to measure orientation and accurate misfit between γ and γ’ phases via high-resolution X-ray diffraction

Although it is important to measure the lattice misfit and orientation in Ni-based single-crystal superalloys to predict their mechanical properties, it is difficult to measure the exact orientation and lattice misfit owing to deviations between the surface and growth direction using conventional x-ray diffraction. Therefore, we developed the growth directional alignment method to measure the orientation and misfit accurately via high-resolution x-ray diffraction. Using this method, we obtained the dominant orientation information both for the out-of-surface and in-surface directions. Moreover, we could achieve sufficient angular resolution during diffraction to measure the lattice misfit between the γ and γ’ phases.