A More Holistic Characterisation Of Internal Interfaces In A Variety of Materials via Complementary Use Of Transmission Kikuchi Diffraction and Atom Probe Tomography

Benjamin M. Jenkins,James O. Douglas,Hazel M. Gardner,David Tweddle,Anna Kareer,Phani S. Karamched,Nick Riddle,Jonathan M. Hyde,Paul A.J. Bagot,G. Robert Odette,Michael P. Moody

Applied Surface Science（2020）

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摘要

•Complementary characterisation of internal interfaces in a diverse range of materials.•Segregation of solutes to grain boundaries characterised using atom probe tomography.•Grain boundaries' five macroscopic degrees of freedom determined from TKD data.

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关键词

Atom probe tomography,Grain boundary,transmission Kikuchi diffraction,Solute segregation

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