Study of the extended defects in CdZnTe crystal

Changhe Zhou,Jianrong Yang,Huixian Yu,Chao Xu, Yuting Shi

Journal of Crystal Growth（2020）

引用 4|浏览18

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摘要

•Measuring tip trajectories of CdZnTe defect etch pits in real-time observation.•Extended defects are complex of multiple dislocation lines.•Extending direction distribution of defects were shown on [1 1 1] pole figure.•Nakagawa etchant cannot reveal large-angle orientated defects.

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关键词

A1. Line Defects,A1. Etching,A1. Characterization,B2. Semiconducting II-VI materials

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