Measurement of stress vector based on polarization ptychography

•A novel stress vector measurement method combining ptychography and polarization technologies is proposed.•Two orthogonal probes are retrieved in a single PIE scan, and three birefringent parameters are extracted by a simple and effective approach.•The feasibility is successfully verified through classic diametrically compressed disc and ring.•This method has good adaptability for large sample. It can be combined with single-shot PIE to realize dynamic measurements.