Concordance rates and biometrical model fitting for operational diagnoses in the Maudsley twin psychosis series.AG Cardno,EJ Marshall,AM Macdonald,B Coid,TR Ribchester,NJ Davies,P Venturi,LA Jones,SW Lewis,PC Sham,II Gottesman, AE Farmer,P McGuffin,AM Reveley,RM MurrayAMERICAN JOURNAL OF MEDICAL GENETICS(1998)引用 0|浏览6暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要