The study of charge injection mechanism of C-60/CuPc organic heterojunction connector layer

The charge injection mechanism of a connector layer is one of the critical issues influencing the performance of tandem organic light-emitting diodes (OLEDs). In this paper, to explore the charge injection mechanism of an organic heterojunction connector (OHJC) layer, we studied the device current density (J) characteristics generated by the C-60/CuPc OHJC layer under different applied voltages (V). By analyzing the log(J)-V-1/2 and ln(J/E)-1/E-2 characteristics of devices, we found that the charge injection mechanism of the C-60/CuPc OHJC layer is in accordance with the Richardson-Schottky model. This study can be a theoretical basis to design high-efficiency OLEDs.